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Method for electrical characterization of nanowires
Ron Gurwitz,
Ilan Shalish
Department of Electrical & Computer Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
13
Scopus citations
Overview
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Engineering & Materials Science
Surface states
87%
Nanowires
76%
Carrier concentration
52%
Carrier mobility
36%
Field effect transistors
26%
Electric properties
26%
Hall mobility
24%
Photoelectrons
19%
Charge carriers
18%
Gallium
17%
Hall effect
16%
Spectrometry
16%
Nanostructures
15%
Chemical vapor deposition
14%
Etching
13%
Electron microscopes
11%
X rays
11%
Semiconductor materials
10%
Oxides
10%
Wire
9%
Geometry
7%
Chemical Compounds
Nanowire
53%
Compound Mobility
46%
Surface State
41%
Field Effect
26%
Band Bending
24%
Photovoltage
20%
Density of Surface States
15%
Electrical Property
14%
Hall Effect
12%
Surface
11%
Photoelectron Spectroscopy
8%
Charge Carrier
8%
Reduction
8%
Etching
7%
Semiconductor
6%
Time
6%
Conductivity
5%
Nanomaterial
5%
Electron Particle
4%
Oxide
4%
Reaction Yield
3%
Medicine & Life Sciences
Nanowires
100%
gallium oxide
33%
Photoelectron Spectroscopy
22%
Semiconductors
21%
Nanostructures
18%
Electrons
12%
X-Rays
11%