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Method for electrical characterization of nanowires
Ron Gurwitz,
Ilan Shalish
Department of Electrical & Computer Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
17
Scopus citations
Overview
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Keyphrases
Nanowires
100%
Electrical Characterization
100%
Carrier Concentration
100%
Surface State Density
100%
Electrical Properties
66%
Surface States
66%
Size Dependence
66%
Surface Band Bending
66%
Carrier Mobility
66%
Critical Radius
33%
Resistivity
33%
Spectrometry
33%
Photoelectron
33%
Transmission Electron Microscope
33%
Charge Carriers
33%
Field Effect
33%
Surface Photovoltage
33%
Photovoltage
33%
Gallium Oxide
33%
NWFET
33%
Field-effect Transistors
33%
Chemical Treatment
33%
Hall Effect
33%
As-grown
33%
Hall Mobility
33%
GaN Nanowires
33%
Channel Mobility
33%
Semiconductor Nanostructures
33%
Effect Model
33%
CVD-grown
33%
Full Depletion
33%
Chemical Perturbation
33%
Wire Diameter
33%
Causal Linkages
33%
Material Science
Nanowire
100%
Density
60%
Carrier Concentration
60%
Carrier Mobility
40%
Field Effect Transistor
40%
Electrical Resistivity
20%
Oxide Compound
20%
Nanocrystalline Material
20%
Gallium
20%
Charge Carrier
20%
Chemical Vapor Deposition
20%
Hall Mobility
20%