Microstructural influence on piezoresponse and leakage current behavior of Na0.5Bi0.5TiO3 Thin Films

Kumaraswamy Miriyala, Ranjith Ramadurai

Research output: Contribution to journalArticlepeer-review

Abstract

Sodium bismuth titanate (Na0.5Bi0.5TiO3: NBT) a lead free piezoelectric; exhibits promising features such that it could be an alternate to lead based piezoelectrics. In this work, we report the microstructural influence on piezoelectric and leakage current behavior of NBT thin films grown by pulsed laser ablation (PLD). Various microstructural features like coarse faceted grains and fine spherical grains was achieved by effective optimization of substrate temperature and oxygen partial pressures. The studies reveals that, leakage current of NBT thin films were dominated by interface limited modified Schottky emission type of conduction. The piezoelectric domain studies reveal that for NBT thin films with fine spherical grain the domain pattern was highly dominated by the morphology and in the case of coarse faceted grains the domains were relatively large and the domains were extending beyond the grain boundaries.

Original languageEnglish
Pages (from-to)2597-2602
Number of pages6
JournalMRS Advances
Volume1
Issue number37
DOIs
StatePublished - 1 Jan 2016
Externally publishedYes

Keywords

  • laser ablation
  • piezoelectric
  • thin film

ASJC Scopus subject areas

  • Mechanical Engineering
  • Mechanics of Materials
  • Materials Science (all)
  • Condensed Matter Physics

Fingerprint

Dive into the research topics of 'Microstructural influence on piezoresponse and leakage current behavior of Na0.5Bi0.5TiO3 Thin Films'. Together they form a unique fingerprint.

Cite this