Microstructure development and electrical properties of RuO₂-based lead-free thick film resistors

Keyphrases

• Electrical Properties 100%
• Lead-free 100%
• Microstructure Development 100%
• RuO2 100%
• Thick-film Resistor 100%
• Bismuth Borate Glasses 50%
• Phase Separation 25%
• Microstructure Properties 25%
• Thick Film 25%
• Scanning Electron Microscopy 25%
• Negative Effects 25%
• X Ray Diffraction 25%
• Crystal Orientation 25%
• Small Grains 25%
• Bleeding 25%
• Microelectronics 25%
• Resistors 25%
• Morphological Properties 25%
• Sheet Resistance 25%
• Single Grain 25%
• Glassy Matrix 25%
• Glassy State 25%
• Transmission Electron Microscopy Analysis 25%
• Devitrification 25%
• Conductive Phase 25%
• Anomalous Distribution 25%
• Alumina Substrate 25%
• Bismuth Titanate 25%
• Pyrochlore Phase 25%
• Energy Dispersion Spectroscopy 25%
• Temperature Coefficient of Resistance 25%
• Matrix Separation 25%
• Defect Pyrochlore 25%

Material Science

• Thick Films 100%
• Scanning Electron Microscopy 100%
• Bismuthate 100%
• Transmission Electron Microscopy 50%
• Crystalline Material 50%
• Powder 50%
• X-Ray Diffraction 50%
• Aluminum Oxide 50%
• Titanate 50%
• Electron Microscopy 50%
• Bismuth 50%