Microwave noise emission from high Tc thin films

G. Jung, J. Konopka, P. Gierłowski, W. Kula

Research output: Contribution to journalArticlepeer-review

12 Scopus citations


A pronounced X-band microwave noise emission from Y-Ba-Cu-O thin films has been observed. Emission depends strongly on temperture, bias current, and magnetic field. Two types of emission lines can be distinguished in the power versus dc bias spectra. The lines which remain at stable current positions against temperature we tentatively ascribe to the interaction of depinned flux flow with a two-dimensional Josephson junction array. The lines that appear at fixed voltage positions may be attributed to the Josephson radiation of a distributed network of junctions. No significant emission was detected from Bi-Ca-Sr-Cu-O films.

Original languageEnglish
Pages (from-to)2355-2357
Number of pages3
JournalApplied Physics Letters
Issue number23
StatePublished - 1 Dec 1989
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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