Modeling cost benefit analysis of inspection in a production line

I. Tirkel, G. Rabinowitz

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Production management aims to maximize profit by increasing salable output, while reducing inspection cost. This study is based on a semiconductor production line with consecutive deteriorating machines. Each machine is inspected via items it produces, and each inspection triggers a machine's repair, if needed. Inspection related cost includes fixed and variable cost, yield loss cost due to unsalable throughput, and longer flow-time penalty. Effects of inspection capacity and policy on cost are investigated using analytical and simulation models. Under given inspection capacity, yield loss cost decreases with growing inspection rate until a minimum is reached, and then starts to increase with further growing rate. This is explained by the contradicting effects of inspection rate and its response time. Overall inspection related cost grows with capacity and reduces with yield loss. It is illustrated how minimum cost is achieved by determining the inspection capacity and inspection rate.

Original languageEnglish
Title of host publication21st International Conference on Production Research
Subtitle of host publicationInnovation in Product and Production, ICPR 2011 - Conference Proceedings
EditorsTobias Krause, Dieter Spath, Rolf Ilg
PublisherFraunhofer-Verlag
ISBN (Electronic)9783839602935
StatePublished - 1 Jan 2011
Event21st International Conference on Production Research: Innovation in Product and Production, ICPR 2011 - Stuttgart, Germany
Duration: 31 Jul 20114 Aug 2011

Publication series

Name21st International Conference on Production Research: Innovation in Product and Production, ICPR 2011 - Conference Proceedings

Conference

Conference21st International Conference on Production Research: Innovation in Product and Production, ICPR 2011
Country/TerritoryGermany
CityStuttgart
Period31/07/114/08/11

Keywords

  • Cost benefit
  • Inspection policy
  • Production management
  • Semiconductor
  • Yield

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Computer Science Applications
  • Industrial and Manufacturing Engineering

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