Morton (Z) scan based real-time variable resolution CMOS image sensor

Evgeny Artyomov, Yair Rivenson, Guy Levi, Orly Yadid-Pecht

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

An image sensor architecture with an alternative image scan method, based on Morton (Z) order, is presented. This scan, compared to the conventional row (raster) scan, enables faster and efficient mean (average) computation of square image blocks. Digital averaging is used and the pixel data is read out with either the original resolution, a 2×2 or a 4×4 block averaging. A test chip of 128×128 array has been implemented in 0.35 μm CMOS technology, has 15% fill factor, is operated by a 3.3V supply and dissipates 30mW at video rate

Original languageEnglish
Title of host publication11th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2004
Pages145-148
Number of pages4
StatePublished - 1 Dec 2004
Externally publishedYes
Event11th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2004 - Tel Aviv, Israel
Duration: 13 Dec 200415 Dec 2004

Publication series

Name11th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2004

Conference

Conference11th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2004
Country/TerritoryIsrael
CityTel Aviv
Period13/12/0415/12/04

ASJC Scopus subject areas

  • Engineering (all)

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