Abstract
This paper focuses on the following aspects of multifunction system testing: analysis of system requirements and revelation of atomic system functions and their relationships, analysis of input / output variables, analysis of system function groups (clusters), composition of the test sets for each group of atomic system functions. Related problems associated with these aspects are briefly described. Numerical and real world examples illustrate the proposed approach.
| Original language | English |
|---|---|
| Pages (from-to) | 99-108 |
| Number of pages | 10 |
| Journal | Proceedings of IEEE International Symposium on High Assurance Systems Engineering |
| Volume | 8 |
| State | Published - 22 Jun 2004 |
| Event | Proceedings - Eighth IEEE International Symposium on High Assurance Systems Engineering - Tampa, FL, United States Duration: 25 Mar 2004 → 26 Mar 2004 |
ASJC Scopus subject areas
- General Engineering