Multi-function system testing: Composition of test sets

Mark Sh Levin; Mark Last

Multi-function system testing: Composition of test sets

Mark Sh Levin
, Mark Last

Research output: Contribution to journal › Conference article › peer-review

4 Scopus citations

Abstract

This paper focuses on the following aspects of multifunction system testing: analysis of system requirements and revelation of atomic system functions and their relationships, analysis of input / output variables, analysis of system function groups (clusters), composition of the test sets for each group of atomic system functions. Related problems associated with these aspects are briefly described. Numerical and real world examples illustrate the proposed approach.

Original language	English
Pages (from-to)	99-108
Number of pages	10
Journal	Proceedings of IEEE International Symposium on High Assurance Systems Engineering
Volume	8
State	Published - 22 Jun 2004
Event	Proceedings - Eighth IEEE International Symposium on High Assurance Systems Engineering - Tampa, FL, United States Duration: 25 Mar 2004 → 26 Mar 2004

ASJC Scopus subject areas

General Engineering

Cite this

@article{bc50cbf38659422db2168fc624e95e54,

title = "Multi-function system testing: Composition of test sets",

abstract = "This paper focuses on the following aspects of multifunction system testing: analysis of system requirements and revelation of atomic system functions and their relationships, analysis of input / output variables, analysis of system function groups (clusters), composition of the test sets for each group of atomic system functions. Related problems associated with these aspects are briefly described. Numerical and real world examples illustrate the proposed approach.",

author = "Levin, \{Mark Sh\} and Mark Last",

year = "2004",

month = jun,

day = "22",

language = "English",

volume = "8",

pages = "99--108",

journal = "Proceedings of IEEE International Symposium on High Assurance Systems Engineering",

issn = "1530-2059",

publisher = "Institute of Electrical and Electronics Engineers",

note = "Proceedings - Eighth IEEE International Symposium on High Assurance Systems Engineering ; Conference date: 25-03-2004 Through 26-03-2004",

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TY - JOUR

T1 - Multi-function system testing

T2 - Proceedings - Eighth IEEE International Symposium on High Assurance Systems Engineering

AU - Levin, Mark Sh

AU - Last, Mark

PY - 2004/6/22

Y1 - 2004/6/22

N2 - This paper focuses on the following aspects of multifunction system testing: analysis of system requirements and revelation of atomic system functions and their relationships, analysis of input / output variables, analysis of system function groups (clusters), composition of the test sets for each group of atomic system functions. Related problems associated with these aspects are briefly described. Numerical and real world examples illustrate the proposed approach.

AB - This paper focuses on the following aspects of multifunction system testing: analysis of system requirements and revelation of atomic system functions and their relationships, analysis of input / output variables, analysis of system function groups (clusters), composition of the test sets for each group of atomic system functions. Related problems associated with these aspects are briefly described. Numerical and real world examples illustrate the proposed approach.

UR - https://www.scopus.com/pages/publications/2942619082

M3 - Conference article

AN - SCOPUS:2942619082

SN - 1530-2059

VL - 8

SP - 99

EP - 108

JO - Proceedings of IEEE International Symposium on High Assurance Systems Engineering

JF - Proceedings of IEEE International Symposium on High Assurance Systems Engineering

Y2 - 25 March 2004 through 26 March 2004

ER -

Multi-function system testing: Composition of test sets

Abstract

ASJC Scopus subject areas

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