Multiple wavelengths real time phase shift interference microscopy

Avner Safrani (Inventor), Michael Ney (Inventor), Ibrahim Abdulhalim (Inventor)

Research output: Patent


A system microscopy system and method that enable obtaining high resolution 3D images in a single shot are presented. The system is an ultra-high speed, real time multi wavelength phase shift interference microscopy system that uses three synchronized color CCD cameras. Each CCD is equipped with a precision achromatic phase mask which in turn allows obtaining π/2 phase shifted signals in three different wavelengths simultaneously.

Original languageEnglish
Patent numberUS9880377
IPCG02B 27/ 28 A I
Priority date9/09/16
StatePublished - 30 Jan 2018


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