Multiple wavelengths real time phase shift interference microscopy

Avner Safrani; Michael Ney; Ibrahim Abdulhalim

Multiple wavelengths real time phase shift interference microscopy

Avner Safrani (Inventor), Michael Ney (Inventor), Ibrahim Abdulhalim (Inventor)

Unit of Photonics and Electro-Optics Engineering

Research output: Patent

Abstract

A system microscopy system and method that enable obtaining high resolution 3D images in a single shot are presented. The system is an ultra-high speed, real time multi wavelength phase shift interference microscopy system that uses three synchronized color CCD cameras. Each CCD is equipped with a precision achromatic phase mask which in turn allows obtaining π/2 phase shifted signals in three different wavelengths simultaneously.

Original language	English
Patent number	US9880377
IPC	G02B 27/ 28 A I
Priority date	9/09/16
State	Published - 30 Jan 2018

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title = "Multiple wavelengths real time phase shift interference microscopy",

abstract = "A system microscopy system and method that enable obtaining high resolution 3D images in a single shot are presented. The system is an ultra-high speed, real time multi wavelength phase shift interference microscopy system that uses three synchronized color CCD cameras. Each CCD is equipped with a precision achromatic phase mask which in turn allows obtaining π/2 phase shifted signals in three different wavelengths simultaneously.",

author = "Avner Safrani and Michael Ney and Ibrahim Abdulhalim",

year = "2018",

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language = "English",

type = "Patent",

note = "US9880377; G02B 27/ 28 A I",

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AU - Ney, Michael

AU - Abdulhalim, Ibrahim

PY - 2018/1/30

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N2 - A system microscopy system and method that enable obtaining high resolution 3D images in a single shot are presented. The system is an ultra-high speed, real time multi wavelength phase shift interference microscopy system that uses three synchronized color CCD cameras. Each CCD is equipped with a precision achromatic phase mask which in turn allows obtaining π/2 phase shifted signals in three different wavelengths simultaneously.

AB - A system microscopy system and method that enable obtaining high resolution 3D images in a single shot are presented. The system is an ultra-high speed, real time multi wavelength phase shift interference microscopy system that uses three synchronized color CCD cameras. Each CCD is equipped with a precision achromatic phase mask which in turn allows obtaining π/2 phase shifted signals in three different wavelengths simultaneously.

M3 - Patent

M1 - US9880377

ER -

Multiple wavelengths real time phase shift interference microscopy

Abstract

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