@article{cb5f56f9969f4736badd8bf01411784f,
title = "n-type (Zr,Ti)NiSn half Heusler materials via mechanical alloying: Structure, Sb-doping and thermoelectric properties",
abstract = "Mechanical alloying has been applied, as an advantageous scalable method, to synthesize Ti1-xZrxNiSn half Heusler materials. This is the first time a synthesis of single phase n-type Ti1-xZrxNiSn half Heusler solid solutions is reported by this technique, along with structural studies and thermoelectric properties. The application of mechanical alloying was successful, as all compositions ranging between x = 0.4–0.8 were in general single phase materials. The lattice thermal conductivity of the series was lower compared to the same compositions prepared by arc melting. Ti0.4Zr0.6NiSn exhibited the minimum lattice thermal conductivity of the series and was selected for doping studies with Sb, with the scope to enhance the thermoelectric performance via the power factor modification. Thermoelectric property measurements resulted in a maximum figure of merit of 0.71 at 762K for Ti0.4Zr0.6NiSn doped with 1.5% Sb.",
keywords = "Ball milling, Half Heusler, Solid solutions, Structural properties, Synthesis, Thermoelectric",
author = "G. Mesaritis and I. Ioannou and A. Delimitis and E. Hatzikraniotis and Y. Gelbstein and Th Kyratsi",
note = "Funding Information: This research was supported by the M-Era.Net project MarTEnergy, funded by the Cyprus Research Promotion Foundation ( P2P/KOINA/M-ERA.NET/ 0317/04 ) and the Ministry of Science Technology and Space, Israel . Funding Information: All samples were characterized by X-ray Powder Diffraction (XRD) using a Rigaku Miniflex diffractometer at different milling steps. The morphological characterization was carried out by a Tescan Scanning Electron Microscope (SEM) and a Bruker Energy Dispersive X-Ray Spectrometer (EDS). Transmission electron microscopy (TEM, HRTEM) experiments were performed on a JEOL 2011 microscope, operating at an accelerating voltage of 200 kV and with a point resolution of 0.25 nm. The TEM was equipped with an EDS detector (EDAX Apollo XLT TEM-SDD) with a resolution of 135 eV (Mn K line). Samples suitable for TEM analysis were prepared by evenly dispersing crushed material on ultrathin lacey C-films supported on 3.05 mm Cu grids.This research was supported by the M-Era.Net project MarTEnergy, funded by the Cyprus Research Promotion Foundation (P2P/KOINA/M-ERA.NET/ 0317/04) and the Ministry of Science Technology and Space, Israel. Publisher Copyright: {\textcopyright} 2022 Elsevier Ltd",
year = "2022",
month = aug,
day = "1",
doi = "10.1016/j.jpcs.2022.110735",
language = "English",
volume = "167",
journal = "Journal of Physics and Chemistry of Solids",
issn = "0022-3697",
publisher = "Elsevier Ltd.",
}