Abstract
This paper presents the results using an alternative defects and strain minimizing technique with nanostructures as the compliant layer to grow III-V nitrides onto foreign substrates. Defects reduction amd stress relaxation had been observed through HRTEM on GaN grown on sapphire and silicon. Results of LED devices on silicon with performance compatible with those on sapphire are presented.
Original language | English |
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Pages (from-to) | 187-190 |
Number of pages | 4 |
Journal | Journal of Light and Visual Environment |
Volume | 32 |
Issue number | 2 |
DOIs | |
State | Published - 1 Dec 2008 |
Externally published | Yes |
Keywords
- GaN
- Light emitting diodes
- Nano-pendeo
- Silicon
ASJC Scopus subject areas
- Electrical and Electronic Engineering