Nanoparticles functionalized probes and methods for preparing such probes

Uri Banin (Inventor), Taleb Mokari (Inventor), Yuval Ebenstein (Inventor)

Research output: Patent

Abstract

The present invention provides probes functionalized with nanoparticles, methods for binding nanoparticles to the probes and the use of such probes in nanometer scale imaging techniques. More specifically, the present invention provides a tip device having at least a portion thereof with an outer surface bound to at least one sub-layer of a material comprising nanoparticles, the nanoparticles acting as donors, acceptors, modifiers, quenchers and/or enhancers with respect to electromagnetic radiation.

Original languageEnglish
Patent numberUS2007035724
IPCG01Q 70/ 18 A I
Priority date8/07/04
StatePublished - 15 Feb 2007

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