Abstract
The conditions for the formation of current-controllable negative differential resistance (CCNR) and actual negative resistance characteristics in the input terminals of common base transistor circuits are discussed. Analysis of a linear approximation to the characteristics leads to a discussion of the effects of internal and external resistances and the difference between theoretical and practical results. A conclusion is deanw as to how the transistor parameters and the external circuit influence the device characteristic.
| Original language | English |
|---|---|
| Pages (from-to) | 27-32 |
| Number of pages | 6 |
| Journal | Microelectronics Journal |
| Volume | 9 |
| Issue number | 4 |
| State | Published - 1 Jan 1979 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering