The conditions for the formation of current-controllable negative differential resistance (CCNR) and actual negative resistance characteristics in the input terminals of common base transistor circuits are discussed. Analysis of a linear approximation to the characteristics leads to a discussion of the effects of internal and external resistances and the difference between theoretical and practical results. A conclusion is deanw as to how the transistor parameters and the external circuit influence the device characteristic.
|Number of pages||6|
|State||Published - 1 Jan 1979|