Abstract
We demonstrate intersuband InGaN/(Al)GaN quantum well infrared
photodetectors grown on a free standing non-polar m-plane GaN substrate.
The devices are grown by metal organic chemical vapor deposition and
exhibit TM-polarized photocurrent at peak wavelengths of 7.5 and 9.3
μm at temperature of 14 K. Based on the experimental data of
intersubband and interband transition energies and 8-band k . p
Schrödinger-Poisson solver calculations, we were able to estimate
the conduction band offset to valence band offset discontinuity ratio
(ΔEc:ΔEv) of 57:43 for
In0.1Ga0.9N/GaN and 55:45, for
In0.095GA0.905N/Al0.07Ga0.93N
non-polar m-plane multi-quantum well structures.
Original language | English GB |
---|---|
Article number | 022110 |
Pages (from-to) | 22110 |
Journal | Applied Physics Letters |
Volume | 103 |
Issue number | 2 |
DOIs | |
State | Published - 1 Jul 2013 |
Externally published | Yes |
Keywords
- aluminium compounds
- conduction bands
- gallium compounds
- III-V semiconductors
- indium compounds
- infrared detectors
- k.p calculations
- MOCVD
- photoconductivity
- photodetectors
- Poisson equation
- Schrodinger equation
- semiconductor growth
- semiconductor quantum wells
- valence bands
- wide band gap semiconductors
- Photodetectors