Nonlocal means variants filtering methods for speckle noise reduction in digital speckle pattern interferometric fringes

Yassine Tounsi, Manoj Kumar, Abdelkrim Nassim, Fernando Mendoza-Santoyo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Nonlocal means (NLM) and its variant filtering methods such as nonlocal means-average (NLM-av), nonlocal meanslocal polynomial regression (NLM-LPR), and nonlocal means-shape adaptive patches (NLM-SAP) for speckle noise reduction in digital speckle pattern interferometric (DSPI) fringes are presented. The performance of these filtering methods is appraised by several criteria such as peak signal-to-noise ratio (PSNR), the quality index (Q), and the edge preservation index (EPI). The obtained filtering results corroborate the effectiveness of NLM and its variant filtering methods for speckle noise reduction in DSPI fringes.

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection XI
EditorsPeter Lehmann, Wolfgang Osten, Armando Albertazzi Goncalves
PublisherSPIE
ISBN (Electronic)9781510627918
DOIs
StatePublished - 1 Jan 2019
Externally publishedYes
EventOptical Measurement Systems for Industrial Inspection XI 2019 - Munich, Germany
Duration: 24 Jun 201927 Jun 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11056
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Measurement Systems for Industrial Inspection XI 2019
Country/TerritoryGermany
CityMunich
Period24/06/1927/06/19

Keywords

  • Digital speckle pattern interferometery
  • Nonlocal means
  • Nonlocal means-Average
  • Nonlocal means-local polynomial regression
  • Nonlocal means-shape adaptive patches.
  • Speckle noise reduction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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