TY - GEN
T1 - Nonlocal means variants filtering methods for speckle noise reduction in digital speckle pattern interferometric fringes
AU - Tounsi, Yassine
AU - Kumar, Manoj
AU - Nassim, Abdelkrim
AU - Mendoza-Santoyo, Fernando
N1 - Publisher Copyright:
© SPIE. Downloading of the abstract is permitted for personal use only.
PY - 2019/1/1
Y1 - 2019/1/1
N2 - Nonlocal means (NLM) and its variant filtering methods such as nonlocal means-average (NLM-av), nonlocal meanslocal polynomial regression (NLM-LPR), and nonlocal means-shape adaptive patches (NLM-SAP) for speckle noise reduction in digital speckle pattern interferometric (DSPI) fringes are presented. The performance of these filtering methods is appraised by several criteria such as peak signal-to-noise ratio (PSNR), the quality index (Q), and the edge preservation index (EPI). The obtained filtering results corroborate the effectiveness of NLM and its variant filtering methods for speckle noise reduction in DSPI fringes.
AB - Nonlocal means (NLM) and its variant filtering methods such as nonlocal means-average (NLM-av), nonlocal meanslocal polynomial regression (NLM-LPR), and nonlocal means-shape adaptive patches (NLM-SAP) for speckle noise reduction in digital speckle pattern interferometric (DSPI) fringes are presented. The performance of these filtering methods is appraised by several criteria such as peak signal-to-noise ratio (PSNR), the quality index (Q), and the edge preservation index (EPI). The obtained filtering results corroborate the effectiveness of NLM and its variant filtering methods for speckle noise reduction in DSPI fringes.
KW - Digital speckle pattern interferometery
KW - Nonlocal means
KW - Nonlocal means-Average
KW - Nonlocal means-local polynomial regression
KW - Nonlocal means-shape adaptive patches.
KW - Speckle noise reduction
UR - http://www.scopus.com/inward/record.url?scp=85076702372&partnerID=8YFLogxK
U2 - 10.1117/12.2524004
DO - 10.1117/12.2524004
M3 - Conference contribution
AN - SCOPUS:85076702372
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Measurement Systems for Industrial Inspection XI
A2 - Lehmann, Peter
A2 - Osten, Wolfgang
A2 - Goncalves, Armando Albertazzi
PB - SPIE
T2 - Optical Measurement Systems for Industrial Inspection XI 2019
Y2 - 24 June 2019 through 27 June 2019
ER -