TY - GEN
T1 - On features ordering for rapid object detection
AU - Cohen, Shimon
AU - Shimony, Solomon Eyal
AU - Brafman, Ronen I.
PY - 2008/12/1
Y1 - 2008/12/1
N2 - Consider a real time classification problem which requires testing the value of a large number of features. Let Tj be the average computation time of the jth feature, and let Rj be its average rejection probability. In many real-world problems, such as defect detection on printed circuits or plasma screens, minimizing classifier execution time is of paramount importance because of its effect on the entire productions and QA process. We show that if features are independent, the best way to arrange them is according to the ratio Rj/Tj. This yields a minimal-time algorithm for features ordering in object detection framework when feature values are independent of each other, and motivates a simple algorithm for ordering features that are not independent. The algorithm obtains comparable classification results to [15], but is twice as fast.
AB - Consider a real time classification problem which requires testing the value of a large number of features. Let Tj be the average computation time of the jth feature, and let Rj be its average rejection probability. In many real-world problems, such as defect detection on printed circuits or plasma screens, minimizing classifier execution time is of paramount importance because of its effect on the entire productions and QA process. We show that if features are independent, the best way to arrange them is according to the ratio Rj/Tj. This yields a minimal-time algorithm for features ordering in object detection framework when feature values are independent of each other, and motivates a simple algorithm for ordering features that are not independent. The algorithm obtains comparable classification results to [15], but is twice as fast.
KW - Feature ordering
KW - Processing time
KW - Rejection probability
UR - http://www.scopus.com/inward/record.url?scp=62749144034&partnerID=8YFLogxK
U2 - 10.1109/EEEI.2008.4736580
DO - 10.1109/EEEI.2008.4736580
M3 - Conference contribution
AN - SCOPUS:62749144034
SN - 9781424424825
T3 - IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings
SP - 509
EP - 513
BT - 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2008
T2 - 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2008
Y2 - 3 December 2008 through 5 December 2008
ER -