Abstract
An analytical expression for the atomic charge fluxes in planar molecular systems is given in terms of specific second derivatives of the molecular dipole moments. This, together with previously derived expressions for the atomic charges and point dipoles, offers a formal and rigorous basis for the analysis of IR intensities in planar systems in terms of well-defined quantum-mechanical observables (expectation values). The suggested formalism is consistent with the ECCF model.
Original language | English |
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Pages (from-to) | 211-216 |
Number of pages | 6 |
Journal | Chemical Physics Letters |
Volume | 166 |
Issue number | 2 |
DOIs | |
State | Published - 16 Feb 1990 |
ASJC Scopus subject areas
- Physics and Astronomy (all)
- Physical and Theoretical Chemistry