On the origin of low frequency noise in HTCS thin films

Grzegorz Jung; Michele Bonaldi; Stefano Vitale; Janusz Konopka

doi:10.1016/0921-4534(91)90680-W

On the origin of low frequency noise in HTCS thin films

Grzegorz Jung, Michele Bonaldi, Stefano Vitale, Janusz Konopka

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Pronounced low frequency voltage noise extending into MHz frequencies was observed in current biased granular Y-Ba-Cu-O films. At some particular bias conditions it was possible to isolate the random telegraph voltage noise produced by a single elementary two-level fluctuator. The telegraph signal and the power spectrum of the noise depended strongly on the dc bias current and on the applied magnetic field. On the basis of experimental observations two alternative mechanisms; charge carrier trapping in the barriers of intrinsic Josephson junctions and magnetic flux jumping, auto-detected by intrinsic dc SQUIDS, are proposed as possible sources of the 1/f noise in superconducting high-T_c films.

Original language	English
Pages (from-to)	276-279
Number of pages	4
Journal	Physica C: Superconductivity and its Applications
Volume	180
Issue number	1-4
DOIs	https://doi.org/10.1016/0921-4534(91)90680-W
State	Published - 1 Jan 1991
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

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10.1016/0921-4534(91)90680-W

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abstract = "Pronounced low frequency voltage noise extending into MHz frequencies was observed in current biased granular Y-Ba-Cu-O films. At some particular bias conditions it was possible to isolate the random telegraph voltage noise produced by a single elementary two-level fluctuator. The telegraph signal and the power spectrum of the noise depended strongly on the dc bias current and on the applied magnetic field. On the basis of experimental observations two alternative mechanisms; charge carrier trapping in the barriers of intrinsic Josephson junctions and magnetic flux jumping, auto-detected by intrinsic dc SQUIDS, are proposed as possible sources of the 1/f noise in superconducting high-Tc films.",

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T1 - On the origin of low frequency noise in HTCS thin films

AU - Jung, Grzegorz

AU - Bonaldi, Michele

AU - Vitale, Stefano

AU - Konopka, Janusz

PY - 1991/1/1

Y1 - 1991/1/1

N2 - Pronounced low frequency voltage noise extending into MHz frequencies was observed in current biased granular Y-Ba-Cu-O films. At some particular bias conditions it was possible to isolate the random telegraph voltage noise produced by a single elementary two-level fluctuator. The telegraph signal and the power spectrum of the noise depended strongly on the dc bias current and on the applied magnetic field. On the basis of experimental observations two alternative mechanisms; charge carrier trapping in the barriers of intrinsic Josephson junctions and magnetic flux jumping, auto-detected by intrinsic dc SQUIDS, are proposed as possible sources of the 1/f noise in superconducting high-Tc films.

AB - Pronounced low frequency voltage noise extending into MHz frequencies was observed in current biased granular Y-Ba-Cu-O films. At some particular bias conditions it was possible to isolate the random telegraph voltage noise produced by a single elementary two-level fluctuator. The telegraph signal and the power spectrum of the noise depended strongly on the dc bias current and on the applied magnetic field. On the basis of experimental observations two alternative mechanisms; charge carrier trapping in the barriers of intrinsic Josephson junctions and magnetic flux jumping, auto-detected by intrinsic dc SQUIDS, are proposed as possible sources of the 1/f noise in superconducting high-Tc films.

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JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

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On the origin of low frequency noise in HTCS thin films

Abstract

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