On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs

Keyphrases

• Stress-induced 100%
• GaN HEMT 100%
• Trap-assisted 100%
• Safe Operating Space 100%
• On the Fly 50%
• Defect Evolution 50%
• Stress Evolution 50%
• Raman Characterization 50%
• Physics of Failure 50%
• C-V Characterization 50%
• Recess Depth 50%
• Pulse Characterization 50%
• Post-failure Analysis 50%

Engineering

• Induced Stress 100%
• Area Limit 100%
• Operating Area 100%
• Defects 50%
• Failure Analysis 50%
• Service-Oriented Architecture 50%