TY - GEN
T1 - Optical constants of InP and GaP
AU - Djurišić, Aleksandra B.
AU - Rakić, Aleksandar D.
AU - Elazar, Jovan M.
AU - Li, E. Herbert
AU - Majewski, Marian L.
PY - 2000/1/1
Y1 - 2000/1/1
N2 - Calculation of the optical constants of InP and GaP is presented. The employed model is a modification of Adachi's model of the optical constants of semiconductors, which employs adjustable broadening instead of the conventional Lorentzian one. In this work we do not take into account excitonic effects at E1 and E1+Δ 1 critical points. In such a manner, fewer adjustable model parameters are required and the term with dubious physical interpretation describing excitons at E1 and E 1+Δ 1 is left out. We obtain excellent agreement with experimental data over the entire 1-6 eV range, with relative rms error for the refractive index equal 1.0% for InP and 1.2% for GaP.
AB - Calculation of the optical constants of InP and GaP is presented. The employed model is a modification of Adachi's model of the optical constants of semiconductors, which employs adjustable broadening instead of the conventional Lorentzian one. In this work we do not take into account excitonic effects at E1 and E1+Δ 1 critical points. In such a manner, fewer adjustable model parameters are required and the term with dubious physical interpretation describing excitons at E1 and E 1+Δ 1 is left out. We obtain excellent agreement with experimental data over the entire 1-6 eV range, with relative rms error for the refractive index equal 1.0% for InP and 1.2% for GaP.
UR - http://www.scopus.com/inward/record.url?scp=84906838283&partnerID=8YFLogxK
U2 - 10.1109/ICMEL.2000.840571
DO - 10.1109/ICMEL.2000.840571
M3 - Conference contribution
AN - SCOPUS:84906838283
SN - 0780352351
SN - 9780780352353
T3 - 2000 22nd International Conference on Microelectronics, MIEL 2000 - Proceedings
SP - 269
EP - 272
BT - 2000 22nd International Conference on Microelectronics, MIEL 2000 - Proceedings
PB - Institute of Electrical and Electronics Engineers
T2 - 2000 22nd International Conference on Microelectronics, MIEL 2000
Y2 - 14 May 2000 through 17 May 2000
ER -