Optimal allocation of testers to products with a queue time restriction in sort testing

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The test of each wafer product in Sort (final IC testing) is done by allocating a tester and an appropriate Sort Interface Unit (SIU) to the product, to perform the test programs over the wafer. This allocation problem is a more complex allocation problem in the presence of a queue time restriction. In this paper, this problem is formulated and solved to determine the optimal allocation of testers and SIU's to wafer products over a planning horizon, such that overall WIP throughout the planning horizon is minimized. The optimal solution also comprehends restrictions on the amount of wafers that may be shipped to other testing sites and replenishment policies regarding new SIU's.

Original languageEnglish
Title of host publication2013 IEEE International Conference on Robotics and Automation, ICRA 2013
Pages3567-3572
Number of pages6
DOIs
StatePublished - 14 Nov 2013
Externally publishedYes
Event2013 IEEE International Conference on Robotics and Automation, ICRA 2013 - Karlsruhe, Germany
Duration: 6 May 201310 May 2013

Publication series

NameProceedings - IEEE International Conference on Robotics and Automation
ISSN (Print)1050-4729

Conference

Conference2013 IEEE International Conference on Robotics and Automation, ICRA 2013
Country/TerritoryGermany
CityKarlsruhe
Period6/05/1310/05/13

Keywords

  • Allocation Problem
  • Automatic Test Equipment (ATE)
  • Optimization
  • Queue Time
  • Throughput

ASJC Scopus subject areas

  • Software
  • Control and Systems Engineering
  • Artificial Intelligence
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Optimal allocation of testers to products with a queue time restriction in sort testing'. Together they form a unique fingerprint.

Cite this