TY - GEN
T1 - Optimal allocation of testers to products with a queue time restriction in sort testing
AU - Kalir, Adar
PY - 2013/11/14
Y1 - 2013/11/14
N2 - The test of each wafer product in Sort (final IC testing) is done by allocating a tester and an appropriate Sort Interface Unit (SIU) to the product, to perform the test programs over the wafer. This allocation problem is a more complex allocation problem in the presence of a queue time restriction. In this paper, this problem is formulated and solved to determine the optimal allocation of testers and SIU's to wafer products over a planning horizon, such that overall WIP throughout the planning horizon is minimized. The optimal solution also comprehends restrictions on the amount of wafers that may be shipped to other testing sites and replenishment policies regarding new SIU's.
AB - The test of each wafer product in Sort (final IC testing) is done by allocating a tester and an appropriate Sort Interface Unit (SIU) to the product, to perform the test programs over the wafer. This allocation problem is a more complex allocation problem in the presence of a queue time restriction. In this paper, this problem is formulated and solved to determine the optimal allocation of testers and SIU's to wafer products over a planning horizon, such that overall WIP throughout the planning horizon is minimized. The optimal solution also comprehends restrictions on the amount of wafers that may be shipped to other testing sites and replenishment policies regarding new SIU's.
KW - Allocation Problem
KW - Automatic Test Equipment (ATE)
KW - Optimization
KW - Queue Time
KW - Throughput
UR - http://www.scopus.com/inward/record.url?scp=84887276768&partnerID=8YFLogxK
U2 - 10.1109/ICRA.2013.6631077
DO - 10.1109/ICRA.2013.6631077
M3 - Conference contribution
AN - SCOPUS:84887276768
SN - 9781467356411
T3 - Proceedings - IEEE International Conference on Robotics and Automation
SP - 3567
EP - 3572
BT - 2013 IEEE International Conference on Robotics and Automation, ICRA 2013
T2 - 2013 IEEE International Conference on Robotics and Automation, ICRA 2013
Y2 - 6 May 2013 through 10 May 2013
ER -