Abstract
A new criterion for linear mapping of the samples from two classes is presented. Some parametric and nonparametric forms of the criterion are suggested. Based on them most of the known linear mapping projections can be created. New projections can be obtained as well. An experimental study with synthetic and real data is discussed. It confirms the effectiveness of the new mapping projections for the data with complicated classification structure.
Original language | English |
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Pages (from-to) | 543-553 |
Number of pages | 11 |
Journal | Pattern Recognition |
Volume | 24 |
Issue number | 6 |
DOIs | |
State | Published - 1 Jan 1991 |
Keywords
- Classifier design
- Exploratory data analysis
- Feature extraction
- Mapping
ASJC Scopus subject areas
- Software
- Signal Processing
- Computer Vision and Pattern Recognition
- Artificial Intelligence