Path loss pattern prediction in Tokyo city based on deterministic ray tracing and stochastic multi-parametric approaches

N. Blaunstein, D. Katz, M. Hayakawa, Y. Sanoh

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This study is related to investigation of two planning tools based on the deterministic ray tracing model, as direct computations of numerous rays arriving at the receiver, and the stochastic multi-parametric model, as combination of statistical description of the built-up rough terrain, and of radio propagation accounting for multiple reflection, scattering and diffraction. Comparison between these two theoretical predictors is done for description of the total path loss pattern in urban environment and is shown that simple engineering formulas, obtained from the stochastic multi-parametric model, have vivid physical and mathematical form converted in the "straight line" equations.

Original languageEnglish
Title of host publicationEuropean Conference on Antennas and Propagation, EuCAP 2009, Proceedings
Pages3249-3253
Number of pages5
StatePublished - 16 Oct 2009
Event3rd European Conference on Antennas and Propagation, EuCAP 2009 - Berlin, Germany
Duration: 23 Mar 200927 Mar 2009

Publication series

NameEuropean Conference on Antennas and Propagation, EuCAP 2009, Proceedings

Conference

Conference3rd European Conference on Antennas and Propagation, EuCAP 2009
Country/TerritoryGermany
CityBerlin
Period23/03/0927/03/09

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Communication

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