Abstract
The crystalline structure, Electron Paramagnetic Resonance and Surface Photovoltage (SPV) spectra of C60 thin films and the photovoltaic properties of C60/Ag and C60/Si interfaces are reported. The SPV spectra of C60 films, C60/Ag and C60/Si interfaces are presented and analyzed on the basis of a model of C60 film electron structure including mobility gap, band tails extending into the gap and two deep level states in the gap. I-V characteristics of the C60/Ag and the C60/p-Si interfaces were measured. Both device structures are shown to exhibit rectifying behavior in the dark and photovoltaic properties. The solar cell parameters are presented.
Original language | English |
---|---|
Pages (from-to) | 113-118 |
Number of pages | 6 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 485 |
State | Published - 1 Jan 1998 |
Event | Proceedings of the 1997 MRS Fall Meeting - Boston, MA, USA Duration: 2 Dec 1997 → 5 Dec 1997 |
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering