The crystalline structure, Electron Paramagnetic Resonance and Surface Photovoltage (SPV) spectra of C60 thin films and the photovoltaic properties of C60/Ag and C60/Si interfaces are reported. The SPV spectra of C60 films, C60/Ag and C60/Si interfaces are presented and analyzed on the basis of a model of C60 film electron structure including mobility gap, band tails extending into the gap and two deep level states in the gap. I-V characteristics of the C60/Ag and the C60/p-Si interfaces were measured. Both device structures are shown to exhibit rectifying behavior in the dark and photovoltaic properties. The solar cell parameters are presented.