Abstract
Sol-gel techniques were used to prepare thin films of Pb(Zr x ,Ti1-x )O3 (PZT) with three different Zr/Ti ratios and a graded PZT film with three different compositional layers. A Michelson interferometer was used to measure the thickness strains due to an applied ac electric field. Effective d 33 piezoelectric strain coefficients were computed from the experimental data. Interfacial pinning caused these coefficients to differ from the true ones. They were corrected for the pinning using both an analytical model and finite-element analysis. The corrected coefficients of the PZT (52/48) sample were in excellent agreement with values of bulk materials. The coefficients of the multilayer sample were very low, probably due to insufficient poling or domain switching.
Original language | English |
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Pages (from-to) | 659-663 |
Number of pages | 5 |
Journal | Applied Physics A: Materials Science and Processing |
Volume | 92 |
Issue number | 3 |
DOIs | |
State | Published - 1 Aug 2008 |
ASJC Scopus subject areas
- General Chemistry
- General Materials Science