Pinhole mediated electrical transport across LaTiO3/SrTiO 3 and LaAlO3/SrTiO3 oxide hetero-structures

Pramod Kumar; Anjana Dogra; Vijaykumar Toutam

doi:10.1063/1.4831685

Pinhole mediated electrical transport across LaTiO₃/SrTiO ₃ and LaAlO₃/SrTiO₃ oxide hetero-structures

Pramod Kumar
, Anjana Dogra
, Vijaykumar Toutam

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

Metal-insulator-metal configuration of LaTiO₃/SrTiO₃ and LaAlO₃/SrTiO₃ hetero-structures between two dimensional electron gas formed at the interface and different area top electrodes is employed for Conductive Atomic force microscopy (CAFM) imaging, Current-Voltage (I-V), and Capacitance-Voltage (C-V) spectroscopy. Electrode area dependent I-V characteristics are observed for these oxide hetero-structures. With small area electrodes, rectifying I-V characteristics are observed, compared to, both tunneling and leakage current characteristics for large area electrodes. CAFM mapping confirmed the presence of pinholes on both surfaces. Resultant I-V characteristics have a contribution from both tunneling and leakage due to pinholes.

Original language	English
Article number	211601
Journal	Applied Physics Letters
Volume	103
Issue number	21
DOIs	https://doi.org/10.1063/1.4831685
State	Published - 18 Nov 2013
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.4831685

Cite this

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title = "Pinhole mediated electrical transport across LaTiO3/SrTiO 3 and LaAlO3/SrTiO3 oxide hetero-structures",

abstract = "Metal-insulator-metal configuration of LaTiO3/SrTiO3 and LaAlO3/SrTiO3 hetero-structures between two dimensional electron gas formed at the interface and different area top electrodes is employed for Conductive Atomic force microscopy (CAFM) imaging, Current-Voltage (I-V), and Capacitance-Voltage (C-V) spectroscopy. Electrode area dependent I-V characteristics are observed for these oxide hetero-structures. With small area electrodes, rectifying I-V characteristics are observed, compared to, both tunneling and leakage current characteristics for large area electrodes. CAFM mapping confirmed the presence of pinholes on both surfaces. Resultant I-V characteristics have a contribution from both tunneling and leakage due to pinholes.",

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T1 - Pinhole mediated electrical transport across LaTiO3/SrTiO 3 and LaAlO3/SrTiO3 oxide hetero-structures

AU - Kumar, Pramod

AU - Dogra, Anjana

AU - Toutam, Vijaykumar

PY - 2013/11/18

Y1 - 2013/11/18

N2 - Metal-insulator-metal configuration of LaTiO3/SrTiO3 and LaAlO3/SrTiO3 hetero-structures between two dimensional electron gas formed at the interface and different area top electrodes is employed for Conductive Atomic force microscopy (CAFM) imaging, Current-Voltage (I-V), and Capacitance-Voltage (C-V) spectroscopy. Electrode area dependent I-V characteristics are observed for these oxide hetero-structures. With small area electrodes, rectifying I-V characteristics are observed, compared to, both tunneling and leakage current characteristics for large area electrodes. CAFM mapping confirmed the presence of pinholes on both surfaces. Resultant I-V characteristics have a contribution from both tunneling and leakage due to pinholes.

AB - Metal-insulator-metal configuration of LaTiO3/SrTiO3 and LaAlO3/SrTiO3 hetero-structures between two dimensional electron gas formed at the interface and different area top electrodes is employed for Conductive Atomic force microscopy (CAFM) imaging, Current-Voltage (I-V), and Capacitance-Voltage (C-V) spectroscopy. Electrode area dependent I-V characteristics are observed for these oxide hetero-structures. With small area electrodes, rectifying I-V characteristics are observed, compared to, both tunneling and leakage current characteristics for large area electrodes. CAFM mapping confirmed the presence of pinholes on both surfaces. Resultant I-V characteristics have a contribution from both tunneling and leakage due to pinholes.

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