TY - GEN
T1 - Platform independent debug port controller architecture with security protection for multi-processor system-on-chip ICs
AU - Akselrod, Dimitry
AU - Ashkenazi, Asaf
AU - Amon, Yossi
PY - 2006/12/1
Y1 - 2006/12/1
N2 - A Debug Port Controller (DPC) architecture, designed for re-use in multiple System-on-Chip (SoC) Integrated Circuits (ICs) is presented. The DPC incorporates security protection against unauthorized access along with advanced debugging features such as long chain debugging, universal BIST engines control, and generic serial interfaces. An implemented security architecture of DPC is presented together with an overall IC security scheme. DPC is the most important part of this IC security scheme. The suggested architecture demonstrates extensive use of the debug process, and re-use of the DPC in multiple SoC ICs without the need of adopting its design for a specific SoC. The implementation of the DPC for IEEE1149.1 standard is presented and the hardware realization of the proposed architecture is described in detail. The DPC that incorporates the proposed architecture has been designed in a 90 nm CMOS process as an integral part of several SoC ICs.
AB - A Debug Port Controller (DPC) architecture, designed for re-use in multiple System-on-Chip (SoC) Integrated Circuits (ICs) is presented. The DPC incorporates security protection against unauthorized access along with advanced debugging features such as long chain debugging, universal BIST engines control, and generic serial interfaces. An implemented security architecture of DPC is presented together with an overall IC security scheme. DPC is the most important part of this IC security scheme. The suggested architecture demonstrates extensive use of the debug process, and re-use of the DPC in multiple SoC ICs without the need of adopting its design for a specific SoC. The implementation of the DPC for IEEE1149.1 standard is presented and the hardware realization of the proposed architecture is described in detail. The DPC that incorporates the proposed architecture has been designed in a 90 nm CMOS process as an integral part of several SoC ICs.
UR - https://www.scopus.com/pages/publications/34047128192
U2 - 10.1109/DATE.2004.1269064
DO - 10.1109/DATE.2004.1269064
M3 - Conference contribution
AN - SCOPUS:34047128192
SN - 0769520855
T3 - Proceedings -Design, Automation and Test in Europe, DATE
BT - Proceedings - Design, Automation and Test in Europe, DATE'06
T2 - Design, Automation and Test in Europe, DATE'06
Y2 - 6 March 2006 through 10 March 2006
ER -