TY - GEN
T1 - Prediction of insulator flashover based on leakage current and humidity measurements
AU - Natan, Erez
AU - Munteanu, Radu
AU - Rabinovici, Raul
PY - 2006/12/1
Y1 - 2006/12/1
N2 - A procedure for prediction of flashover on ceramic insulators based on leakage currents and environmental humidity measurements is presented. A new approach, which takes into account the connection between leakage currents and humidity, for prediction of flashover is presented. The analysis of the leakage current peaks and humidity measurements on the insulator surface for long and different periods of time suggest that as the flashover would be closer, the mean leakage current peak would be higher. Based on this assumption, a new real time process uses a fuzzy logic method to combine humidity and leakage current peak measurements to produce a severity scale. Experimental results are presented.
AB - A procedure for prediction of flashover on ceramic insulators based on leakage currents and environmental humidity measurements is presented. A new approach, which takes into account the connection between leakage currents and humidity, for prediction of flashover is presented. The analysis of the leakage current peaks and humidity measurements on the insulator surface for long and different periods of time suggest that as the flashover would be closer, the mean leakage current peak would be higher. Based on this assumption, a new real time process uses a fuzzy logic method to combine humidity and leakage current peak measurements to produce a severity scale. Experimental results are presented.
UR - http://www.scopus.com/inward/record.url?scp=50249116292&partnerID=8YFLogxK
U2 - 10.1109/EEEI.2006.321067
DO - 10.1109/EEEI.2006.321067
M3 - Conference contribution
AN - SCOPUS:50249116292
SN - 1424402301
SN - 9781424402304
T3 - IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings
SP - 260
EP - 264
BT - 2006 IEEE 24th Convention of Electrical and Electronics Engineers in Israel, IEEEI
T2 - 2006 IEEE 24th Convention of Electrical and Electronics Engineers in Israel, IEEEI
Y2 - 15 November 2006 through 17 November 2006
ER -