Abstract
This paper presents a new method for fault-tolerant computing where for a given error rate, r, the hamming distance between correct inputs and faulty inputs, as well as the hamming distance between correct results and faulty results, is preserved throughout processing; thereby enabling correction of up to r transient faults per computation cycle. The new method is compared and contrasted with current protection methods and its cost/performance is analyzed.
| Original language | English |
|---|---|
| Pages (from-to) | 903-907 |
| Number of pages | 5 |
| Journal | Journal of Electronic Testing: Theory and Applications (JETTA) |
| Volume | 29 |
| Issue number | 6 |
| DOIs | |
| State | Published - 1 Dec 2013 |
Keywords
- Fault-tolerance
- Hamming distance
- Linear error correction codes
ASJC Scopus subject areas
- Electrical and Electronic Engineering