Pressure of correlated layer-charge and counterion fluctuations in charged thin films

D. B. Lukatsky, S. A. Safran

Research output: Contribution to journalArticlepeer-review

44 Scopus citations

Abstract

We predict the fluctuation contribution to the interaction between two surfaces with both mobile layer charges and delocalized counterions. The correlation (coupling) between the layer-charge fluctuations and the counterion fluctuations (around a piecewise homogeneous mean-field density profile) is taken into account in the Gaussian approximation. We find that this correlation significantly increases the magnitude of the interlayer fluctuation attraction. The counterion fluctuation pressure is calculated as a function of the intersurface distance and we show how the large and small distance limits correspond to three-dimensional (3D) and 2D fluctuations, respectively. In addition, we predict the charge density-density correlation functions. Experimental implications of the model are discussed.

Original languageEnglish
Pages (from-to)5848-5857
Number of pages10
JournalPhysical Review E
Volume60
Issue number5 B
DOIs
StatePublished - 1 Jan 1999
Externally publishedYes

ASJC Scopus subject areas

  • Statistical and Nonlinear Physics
  • Statistics and Probability
  • Condensed Matter Physics

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