Abstract
We describe how to probe the amplitude and polarization of the evanescent modes of light emanating from near-field scanning optical microscopes and Bethe-Bouwkamp holes by placing these structures near anisotropic dispersive media. Evanescent modes have different cut-offs for propagation inside the anisotropic medium as a function of the angles made by their wave vectors and the optic axes of the medium. The electromagnetic field mode amplitudes near the tip can be obtained by varying the orientation of the optic axes relative to the tip.
Original language | English |
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Pages (from-to) | 31-38 |
Number of pages | 8 |
Journal | Ultramicroscopy |
Volume | 71 |
Issue number | 1-4 |
DOIs | |
State | Published - 1 Mar 1998 |
Event | Proceedings of the 1997 4th International Conference on Near-Field Optics and Related Techniques, NFO-4 - Jerusalem, Israel Duration: 9 Feb 1997 → 13 Feb 1997 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation