Probing evanescent modes from near-field optical microscopes: Propagation into anisotropic media

Y. B. Band, M. Trippenbach, Garnett W. Bryant, P. S. Julienne

Research output: Contribution to journalConference articlepeer-review

Abstract

We describe how to probe the amplitude and polarization of the evanescent modes of light emanating from near-field scanning optical microscopes and Bethe-Bouwkamp holes by placing these structures near anisotropic dispersive media. Evanescent modes have different cut-offs for propagation inside the anisotropic medium as a function of the angles made by their wave vectors and the optic axes of the medium. The electromagnetic field mode amplitudes near the tip can be obtained by varying the orientation of the optic axes relative to the tip.

Original languageEnglish
Pages (from-to)31-38
Number of pages8
JournalUltramicroscopy
Volume71
Issue number1-4
DOIs
StatePublished - 1 Mar 1998
EventProceedings of the 1997 4th International Conference on Near-Field Optics and Related Techniques, NFO-4 - Jerusalem, Israel
Duration: 9 Feb 199713 Feb 1997

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