Pudenz antisiphon device tear as a cause of shunt malfunction

B. Borowitz, E. Ashkenazi, N. Muallem, S. Constantini

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Antisiphon device (ASD) tear was found in nine patients who underwent ventriculoperitoneal (VP) shunt revision of a Pudenz three-piece system. In six cases this was the only finding, in three, there was an associated distal malfunction. Repair of a ASD tear constituted 27% of our shunt revision procedures. The locus minoris resistentia of the Pudenz ASD is the attachment of the diaphragm to the cylinder. ASD tear should be suspected whenever a nonin-flammatory fluid collection of a CSF leak are found at the proximal extracranial section of this system.

Original languageEnglish
Pages (from-to)330-331
Number of pages2
JournalChild's Nervous System
Volume5
Issue number5
DOIs
StatePublished - 1 Oct 1989
Externally publishedYes

Keywords

  • Antisiphon device
  • Hydrocephalus
  • Shunt malfunction
  • VP shunt

ASJC Scopus subject areas

  • Pediatrics, Perinatology, and Child Health
  • Clinical Neurology

Fingerprint

Dive into the research topics of 'Pudenz antisiphon device tear as a cause of shunt malfunction'. Together they form a unique fingerprint.

Cite this