Abstract
The proposed method is aimed at the analysis of phase distribution in thin surface layers comparable to the penetration depth of X-rays. The phase distribution is modeled mathematically and the parameters of the distribution are evaluated from diffraction data taken for various peaks and with various radiations. The method was applied to the analysis of austenite distribution in cathodically charged stainless steel.
| Original language | English |
|---|---|
| Pages (from-to) | 18-21 |
| Number of pages | 4 |
| Journal | Journal of Applied Crystallography |
| Volume | 17 |
| Issue number | pt 1 |
| DOIs | |
| State | Published - 1 Feb 1984 |
ASJC Scopus subject areas
- General Biochemistry, Genetics and Molecular Biology