Radiation tolerance of NROM embedded products

Michael Lisiansky, Gil Cassuto, Yakov Roizin, Domenico Corso, Sebania Libertino, Antonio Marino, Salvatore A. Lombardo, Isodiana Crupi, Calogero Pace, Felice Crupi, David Fuks, Arik Kiv, Ernesto Della Sala, Giuseppe Capuano, Felix Palumbo

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

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