Random telegraph noise and critical currents of high-Tc superconducting thin films

G. Jung; B. Savo; A. Vecchione; M. Bonaldi; S. Vitale

doi:10.1016/0921-4534(94)91018-9

Random telegraph noise and critical currents of high-T_c superconducting thin films

G. Jung, B. Savo, A. Vecchione, M. Bonaldi, S. Vitale

Department of Physics

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Critical currents determine noise properties of current biased high critical temperature thin films. Manifestations of critical currents depend on microstructure of the investigated film and on the mechanism of noise generation. Therefore, the analysis of the telegraph voltage noise amplitudes dependence on current flow provides an insight into the details pf physical mechanism responsible for noise emissions.

Original language	English
Pages (from-to)	2983-2984
Number of pages	2
Journal	Physica C: Superconductivity and its Applications
Volume	235-240
Issue number	PART 5
DOIs	https://doi.org/10.1016/0921-4534(94)91018-9
State	Published - 1 Jan 1994

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

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10.1016/0921-4534(94)91018-9

Cite this

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title = "Random telegraph noise and critical currents of high-Tc superconducting thin films",

abstract = "Critical currents determine noise properties of current biased high critical temperature thin films. Manifestations of critical currents depend on microstructure of the investigated film and on the mechanism of noise generation. Therefore, the analysis of the telegraph voltage noise amplitudes dependence on current flow provides an insight into the details pf physical mechanism responsible for noise emissions.",

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AU - Savo, B.

AU - Vecchione, A.

AU - Bonaldi, M.

AU - Vitale, S.

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N2 - Critical currents determine noise properties of current biased high critical temperature thin films. Manifestations of critical currents depend on microstructure of the investigated film and on the mechanism of noise generation. Therefore, the analysis of the telegraph voltage noise amplitudes dependence on current flow provides an insight into the details pf physical mechanism responsible for noise emissions.

AB - Critical currents determine noise properties of current biased high critical temperature thin films. Manifestations of critical currents depend on microstructure of the investigated film and on the mechanism of noise generation. Therefore, the analysis of the telegraph voltage noise amplitudes dependence on current flow provides an insight into the details pf physical mechanism responsible for noise emissions.

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Random telegraph noise and critical currents of high-T_c superconducting thin films

Abstract

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