Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness

J. Haefner; A. Fahs; J. Ho; C. Stanford; R. Guenette; C. Adams; H. Almazán; V. Álvarez; B. Aparicio; A. Aranburu; L. Arazi; I. Arnquist; F. Auria-Luna; S. Ayet; C. Azevedo; K. Bailey; F. Ballester; J. Benlloch-Rodríguez; F. Borges; S. Bounasser; N. Byrnes; S. Cárcel; J. Carrión; S. Cebrián; E. Church; C. Conde; T. Contreras; F. Cossío; A. Denisenko; E. Dey; G. Díaz; T. Dickel; J. Escada; R. Esteve; R. Felkai; L. Fernandes; P. Ferrario; A. Ferreira; F. Foss; E. Freitas; Z. Freixa; J. Generowicz; A. Goldschmidt; J. Gómez-Cadenas; R. González; J. Grocott; K. Hafidi; J. Hauptman; C. Henriques; J. Hernando Morata; P. Herrero-Gómez; V. Herrero; P. Ho; Y. Ifergan; B. Jones; M. Kekic; L. Labarga; L. Larizgoitia; P. Lebrun; D. Lopez Gutierrez; N. López-March; R. Madigan; R. Mano; J. Martín-Albo; G. Martínez-Lema; M. Martínez-Vara; A. Marques; Z. Meziani; R. Miller; K. Mistry; J. Molina-Canteras; F. Monrabal; C. Monteiro; F. Mora; J. Muñoz Vidal; K. Navarro; P. Novella; A. Nuñez; D. Nygren; E. Oblak; M. Odriozola-Gimeno; B. Palmeiro; A. Para; M. Querol; A. Redwine; J. Renner; I. Rivilla; J. Rodríguez; C. Rogero; L. Rogers; B. Romeo; C. Romo-Luque; F. Santos; J. dos Santos; A. Simón; M. Sorel; J. Teixeira; J. Toledo; J. Torrent; A. Usón; J. Veloso; T. Vuong; J. Waiton; J. White

doi:10.1088/1748-0221/18/03/P03016

Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness

J. Haefner, A. Fahs, J. Ho, C. Stanford, R. Guenette, C. Adams, H. Almazán, V. Álvarez, B. Aparicio, A. Aranburu, L. Arazi, I. Arnquist, F. Auria-Luna, S. Ayet, C. Azevedo, K. Bailey, F. Ballester, J. Benlloch-Rodríguez, F. Borges, S. BounasserN. Byrnes, S. Cárcel, J. Carrión, S. Cebrián, E. Church, C. Conde, T. Contreras, F. Cossío, A. Denisenko, E. Dey, G. Díaz, T. Dickel, J. Escada, R. Esteve, R. Felkai, L. Fernandes, P. Ferrario, A. Ferreira, F. Foss, E. Freitas, Z. Freixa, J. Generowicz, A. Goldschmidt, J. Gómez-Cadenas, R. González, J. Grocott, K. Hafidi, J. Hauptman, C. Henriques, J. Hernando Morata, P. Herrero-Gómez, V. Herrero, P. Ho, Y. Ifergan, B. Jones, M. Kekic, L. Labarga, L. Larizgoitia, P. Lebrun, D. Lopez Gutierrez, N. López-March, R. Madigan, R. Mano, J. Martín-Albo, G. Martínez-Lema, M. Martínez-Vara, A. Marques, Z. Meziani, R. Miller, K. Mistry, J. Molina-Canteras, F. Monrabal, C. Monteiro, F. Mora, J. Muñoz Vidal, K. Navarro, P. Novella, A. Nuñez, D. Nygren, E. Oblak, M. Odriozola-Gimeno, B. Palmeiro, A. Para, M. Querol, A. Redwine, J. Renner, I. Rivilla, J. Rodríguez, C. Rogero, L. Rogers, B. Romeo, C. Romo-Luque, F. Santos, J. dos Santos, A. Simón, M. Sorel, J. Teixeira, J. Toledo, J. Torrent, A. Usón, J. Veloso, T. Vuong, J. Waiton, J. White

Unit of Nuclear Engineering

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. In noble element systems, it is often coated with tetraphenyl butadiene (TPB) to allow detection of vacuum ultraviolet scintillation light. In this work this dependence is investigated for PTFE coated with TPB in air for light of wavelengths of 200 nm, 260 nm, and 450 nm. The results show that TPB-coated PTFE has a reflectance of approximately 92% for thicknesses ranging from 5 mm to 10 mm at 450 nm, with negligible variation as a function of thickness within this range. A cross-check of these results using an argon chamber supports the conclusion that the change in thickness from 5 mm to 10 mm does not affect significantly the light response at 128 nm. Our results indicate that pieces of TPB-coated PTFE thinner than the typical 10 mm can be used in particle physics detectors without compromising the light signal.

Original language	English
Article number	P03016
Journal	Journal of Instrumentation
Volume	18
Issue number	3
DOIs	https://doi.org/10.1088/1748-0221/18/03/P03016
State	Published - 1 Mar 2023

Keywords

Materials for gaseous detectors
Particle tracking detectors (Gaseous detectors)
Time projection chambers

ASJC Scopus subject areas

Instrumentation
Mathematical Physics

Access to Document

10.1088/1748-0221/18/03/P03016

Cite this

Haefner, J., Fahs, A., Ho, J., Stanford, C., Guenette, R., Adams, C., Almazán, H., Álvarez, V., Aparicio, B., Aranburu, A., Arazi, L., Arnquist, I., Auria-Luna, F., Ayet, S., Azevedo, C., Bailey, K., Ballester, F., Benlloch-Rodríguez, J., Borges, F., ... White, J. (2023). Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness. Journal of Instrumentation, 18(3), Article P03016. https://doi.org/10.1088/1748-0221/18/03/P03016

@article{328e0c4ab346476fb0e2cebbfe689a9c,

title = "Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness",

abstract = "Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. In noble element systems, it is often coated with tetraphenyl butadiene (TPB) to allow detection of vacuum ultraviolet scintillation light. In this work this dependence is investigated for PTFE coated with TPB in air for light of wavelengths of 200 nm, 260 nm, and 450 nm. The results show that TPB-coated PTFE has a reflectance of approximately 92% for thicknesses ranging from 5 mm to 10 mm at 450 nm, with negligible variation as a function of thickness within this range. A cross-check of these results using an argon chamber supports the conclusion that the change in thickness from 5 mm to 10 mm does not affect significantly the light response at 128 nm. Our results indicate that pieces of TPB-coated PTFE thinner than the typical 10 mm can be used in particle physics detectors without compromising the light signal.",

keywords = "Materials for gaseous detectors, Particle tracking detectors (Gaseous detectors), Time projection chambers",

author = "J. Haefner and A. Fahs and J. Ho and C. Stanford and R. Guenette and C. Adams and H. Almaz{\'a}n and V. {\'A}lvarez and B. Aparicio and A. Aranburu and L. Arazi and I. Arnquist and F. Auria-Luna and S. Ayet and C. Azevedo and K. Bailey and F. Ballester and J. Benlloch-Rodr{\'i}guez and F. Borges and S. Bounasser and N. Byrnes and S. C{\'a}rcel and J. Carri{\'o}n and S. Cebri{\'a}n and E. Church and C. Conde and T. Contreras and F. Coss{\'i}o and A. Denisenko and E. Dey and G. D{\'i}az and T. Dickel and J. Escada and R. Esteve and R. Felkai and L. Fernandes and P. Ferrario and A. Ferreira and F. Foss and E. Freitas and Z. Freixa and J. Generowicz and A. Goldschmidt and J. G{\'o}mez-Cadenas and R. Gonz{\'a}lez and J. Grocott and K. Hafidi and J. Hauptman and C. Henriques and J. Hernando Morata and P. Herrero-G{\'o}mez and V. Herrero and P. Ho and Y. Ifergan and B. Jones and M. Kekic and L. Labarga and L. Larizgoitia and P. Lebrun and D. Lopez Gutierrez and N. L{\'o}pez-March and R. Madigan and R. Mano and J. Mart{\'i}n-Albo and G. Mart{\'i}nez-Lema and M. Mart{\'i}nez-Vara and A. Marques and Z. Meziani and R. Miller and K. Mistry and J. Molina-Canteras and F. Monrabal and C. Monteiro and F. Mora and J. Mu{\~n}oz Vidal and K. Navarro and P. Novella and A. Nu{\~n}ez and D. Nygren and E. Oblak and M. Odriozola-Gimeno and B. Palmeiro and A. Para and M. Querol and A. Redwine and J. Renner and I. Rivilla and J. Rodr{\'i}guez and C. Rogero and L. Rogers and B. Romeo and C. Romo-Luque and F. Santos and J. dos Santos and A. Sim{\'o}n and M. Sorel and J. Teixeira and J. Toledo and J. Torrent and A. Us{\'o}n and J. Veloso and T. Vuong and J. Waiton and J. White",

note = "Publisher Copyright: {\textcopyright} 2023 IOP Publishing Ltd and Sissa Medialab.",

year = "2023",

month = mar,

day = "1",

doi = "10.1088/1748-0221/18/03/P03016",

language = "English",

volume = "18",

journal = "Journal of Instrumentation",

issn = "1748-0221",

publisher = "IOP Publishing Ltd.",

number = "3",

}

Haefner, J, Fahs, A, Ho, J, Stanford, C, Guenette, R, Adams, C, Almazán, H, Álvarez, V, Aparicio, B, Aranburu, A, Arazi, L, Arnquist, I, Auria-Luna, F, Ayet, S, Azevedo, C, Bailey, K, Ballester, F, Benlloch-Rodríguez, J, Borges, F, Bounasser, S, Byrnes, N, Cárcel, S, Carrión, J, Cebrián, S, Church, E, Conde, C, Contreras, T, Cossío, F, Denisenko, A, Dey, E, Díaz, G, Dickel, T, Escada, J, Esteve, R, Felkai, R, Fernandes, L, Ferrario, P, Ferreira, A, Foss, F, Freitas, E, Freixa, Z, Generowicz, J, Goldschmidt, A, Gómez-Cadenas, J, González, R, Grocott, J, Hafidi, K, Hauptman, J, Henriques, C, Hernando Morata, J, Herrero-Gómez, P, Herrero, V, Ho, P, Ifergan, Y, Jones, B, Kekic, M, Labarga, L, Larizgoitia, L, Lebrun, P, Lopez Gutierrez, D, López-March, N, Madigan, R, Mano, R, Martín-Albo, J, Martínez-Lema, G, Martínez-Vara, M, Marques, A, Meziani, Z, Miller, R, Mistry, K, Molina-Canteras, J, Monrabal, F, Monteiro, C, Mora, F, Muñoz Vidal, J, Navarro, K, Novella, P, Nuñez, A, Nygren, D, Oblak, E, Odriozola-Gimeno, M, Palmeiro, B, Para, A, Querol, M, Redwine, A, Renner, J, Rivilla, I, Rodríguez, J, Rogero, C, Rogers, L, Romeo, B, Romo-Luque, C, Santos, F, dos Santos, J, Simón, A, Sorel, M, Teixeira, J, Toledo, J, Torrent, J, Usón, A, Veloso, J, Vuong, T, Waiton, J & White, J 2023, 'Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness', Journal of Instrumentation, vol. 18, no. 3, P03016. https://doi.org/10.1088/1748-0221/18/03/P03016

TY - JOUR

T1 - Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness

AU - Haefner, J.

AU - Fahs, A.

AU - Ho, J.

AU - Stanford, C.

AU - Guenette, R.

AU - Adams, C.

AU - Almazán, H.

AU - Álvarez, V.

AU - Aparicio, B.

AU - Aranburu, A.

AU - Arazi, L.

AU - Arnquist, I.

AU - Auria-Luna, F.

AU - Ayet, S.

AU - Azevedo, C.

AU - Bailey, K.

AU - Ballester, F.

AU - Benlloch-Rodríguez, J.

AU - Borges, F.

AU - Bounasser, S.

AU - Byrnes, N.

AU - Cárcel, S.

AU - Carrión, J.

AU - Cebrián, S.

AU - Church, E.

AU - Conde, C.

AU - Contreras, T.

AU - Cossío, F.

AU - Denisenko, A.

AU - Dey, E.

AU - Díaz, G.

AU - Dickel, T.

AU - Escada, J.

AU - Esteve, R.

AU - Felkai, R.

AU - Fernandes, L.

AU - Ferrario, P.

AU - Ferreira, A.

AU - Foss, F.

AU - Freitas, E.

AU - Freixa, Z.

AU - Generowicz, J.

AU - Goldschmidt, A.

AU - Gómez-Cadenas, J.

AU - González, R.

AU - Grocott, J.

AU - Hafidi, K.

AU - Hauptman, J.

AU - Henriques, C.

AU - Hernando Morata, J.

AU - Herrero-Gómez, P.

AU - Herrero, V.

AU - Ho, P.

AU - Ifergan, Y.

AU - Jones, B.

AU - Kekic, M.

AU - Labarga, L.

AU - Larizgoitia, L.

AU - Lebrun, P.

AU - Lopez Gutierrez, D.

AU - López-March, N.

AU - Madigan, R.

AU - Mano, R.

AU - Martín-Albo, J.

AU - Martínez-Lema, G.

AU - Martínez-Vara, M.

AU - Marques, A.

AU - Meziani, Z.

AU - Miller, R.

AU - Mistry, K.

AU - Molina-Canteras, J.

AU - Monrabal, F.

AU - Monteiro, C.

AU - Mora, F.

AU - Muñoz Vidal, J.

AU - Navarro, K.

AU - Novella, P.

AU - Nuñez, A.

AU - Nygren, D.

AU - Oblak, E.

AU - Odriozola-Gimeno, M.

AU - Palmeiro, B.

AU - Para, A.

AU - Querol, M.

AU - Redwine, A.

AU - Renner, J.

AU - Rivilla, I.

AU - Rodríguez, J.

AU - Rogero, C.

AU - Rogers, L.

AU - Romeo, B.

AU - Romo-Luque, C.

AU - Santos, F.

AU - dos Santos, J.

AU - Simón, A.

AU - Sorel, M.

AU - Teixeira, J.

AU - Toledo, J.

AU - Torrent, J.

AU - Usón, A.

AU - Veloso, J.

AU - Vuong, T.

AU - Waiton, J.

AU - White, J.

PY - 2023/3/1

Y1 - 2023/3/1

N2 - Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. In noble element systems, it is often coated with tetraphenyl butadiene (TPB) to allow detection of vacuum ultraviolet scintillation light. In this work this dependence is investigated for PTFE coated with TPB in air for light of wavelengths of 200 nm, 260 nm, and 450 nm. The results show that TPB-coated PTFE has a reflectance of approximately 92% for thicknesses ranging from 5 mm to 10 mm at 450 nm, with negligible variation as a function of thickness within this range. A cross-check of these results using an argon chamber supports the conclusion that the change in thickness from 5 mm to 10 mm does not affect significantly the light response at 128 nm. Our results indicate that pieces of TPB-coated PTFE thinner than the typical 10 mm can be used in particle physics detectors without compromising the light signal.

AB - Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. In noble element systems, it is often coated with tetraphenyl butadiene (TPB) to allow detection of vacuum ultraviolet scintillation light. In this work this dependence is investigated for PTFE coated with TPB in air for light of wavelengths of 200 nm, 260 nm, and 450 nm. The results show that TPB-coated PTFE has a reflectance of approximately 92% for thicknesses ranging from 5 mm to 10 mm at 450 nm, with negligible variation as a function of thickness within this range. A cross-check of these results using an argon chamber supports the conclusion that the change in thickness from 5 mm to 10 mm does not affect significantly the light response at 128 nm. Our results indicate that pieces of TPB-coated PTFE thinner than the typical 10 mm can be used in particle physics detectors without compromising the light signal.

KW - Materials for gaseous detectors

KW - Particle tracking detectors (Gaseous detectors)

KW - Time projection chambers

UR - http://www.scopus.com/inward/record.url?scp=85150486014&partnerID=8YFLogxK

U2 - 10.1088/1748-0221/18/03/P03016

DO - 10.1088/1748-0221/18/03/P03016

M3 - Article

AN - SCOPUS:85150486014

SN - 1748-0221

VL - 18

JO - Journal of Instrumentation

JF - Journal of Instrumentation

IS - 3

M1 - P03016

ER -

Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness

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