Relationship between the measurement and motion bandwidths in magnetic tracking

  • Anton Plotkin
  • , Eugene Paperno
  • , Netzer Moriya

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The relationship between the measurement and motion bandwidths in magnetic tracing is investigated. The measurement bandwidth of a tracing system depends on the sensor output spectrum. The sensor output spect rum is a function of the sensor motion dynamics and the non linearity of the tracing measurement model. Due to the no nlinearity of the measurement model, the sensor output spectrum is wider than the sensor motion spectrum. In the case where the measurement bandwidth is in a wrong relationship with the se nsor output spectrum, excess tracing errors occur. The ratio of the measurem ent and motion bandwidths for which the excess tr acing errors are absent is evaluated for different translation and rotation sensor motion spans. A variety of generic sensor motion spectra is considered. The tracing of a threeaxial m agnetic sensor with a treeaxial dipolefield transmitter is chosen as the representative case. A similar behavior is expected for any other magnetictracing configurations based on dipole reference fields.

Original languageEnglish
Title of host publicationIMTC'06 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference
Pages2165-2170
Number of pages6
DOIs
StatePublished - 1 Dec 2006
EventIMTC'06 - IEEE Instrumentation and Measurement Technology Conference - Sorrento, Italy
Duration: 24 Apr 200627 Apr 2006

Publication series

NameConference Record - IEEE Instrumentation and Measurement Technology Conference
ISSN (Print)1091-5281

Conference

ConferenceIMTC'06 - IEEE Instrumentation and Measurement Technology Conference
Country/TerritoryItaly
CitySorrento
Period24/04/0627/04/06

Keywords

  • Excess tracing errors
  • Magnetic tracing
  • Me asurement bandwidth
  • Measurement model
  • Motion spectrum

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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