Large area square arrays of circular cobalt dots, nominally 100 nm in diameter and 20 nm in thickness, were patterned using interference lithography. Magnetic remanent states were measured using off-axis electron holography in the transmission electron microscope (TEM). The results show that the dots are mostly single domain, although vortex states and multidomain configurations are occasionally observed. Significant magnetic interactions between adjacent dots result in variations in their magnetization direction away from the direction of the applied field. The suitability of such dots for data storage applications is discussed. Quantitative magnetic phase measurements were also obtained by applying the transport of intensity equation to images acquired using the Fresnel mode of Lorentz microscopy in the TEM. The consistency between the electron holography and transport of intensity equation (TIE) results is assessed.