Removal of monotonically increasing or decreasing phase ambiguity in retrieved phase by Riesz transform method in digital interferometric techniques

Yassine Tounsi, Manoj Kumar, Abdelkrim Nassim, Fernando Mendoza-Santoyo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

In this work, a method based on vortex operator, for removal of monotonically increasing or decreasing phase ambiguity in the retrieved phase by the Riesz transform method in digital interferometric techniques is presented. Since in digital interferometric techniques, the phase extraction methods and algorithms are essential because these techniques are being continuously employed in many scientific, industrial, and engineering applications to measure various physical parameters which are encoded as the phase of the fringe pattern. There exist many methods/algorithms for phase extraction from the fringe pattern such as temporal phase-shifting, spatial phase-shifting, fast Fourier transforms (FFT) method, wavelet transform, Hilbert transform etc. In recent years, phase extraction from a single fringe pattern by using the Riesz transform method is developed because of its several advantages. However, the retrieved phase by Riesz transform is affected by πshifts due to the lack of discrimination between positive and negative spatial frequencies. This problem could be resolved by using a vortex operator which filters the data in the frequency domain. We present here some simulated results demonstrating the removal of phase ambiguity in the retrieved phase by Riesz transform method.

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection XI
EditorsPeter Lehmann, Wolfgang Osten, Armando Albertazzi Goncalves
PublisherSPIE
ISBN (Electronic)9781510627918
DOIs
StatePublished - 1 Jan 2019
Externally publishedYes
EventOptical Measurement Systems for Industrial Inspection XI 2019 - Munich, Germany
Duration: 24 Jun 201927 Jun 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11056
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Measurement Systems for Industrial Inspection XI 2019
Country/TerritoryGermany
CityMunich
Period24/06/1927/06/19

Keywords

  • Digital holography
  • Digital speckle pattern interferometry
  • Hilbert transform
  • Phase retrieval
  • Riesz transform

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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