@inproceedings{c87772ddaa8249928cdf3ddb33f3044e,
title = "Resolution enhancement in scanning electron microscopy using deep learning",
abstract = "We present a deep learning-based framework to perform image super-resolution in scanning electron microscopy. The technique was demonstrated to perform a resolution enhancement using a standard resolution test target and hydrogel samples.",
author = "\{de Haan\}, Kevin and Ballard, \{Zachary S.\} and Yair Rivenson and Yichen Wu and Aydogan Ozcan",
note = "Publisher Copyright: {\textcopyright} OSA 2020 {\textcopyright} 2020 The Author (s); CLEO: Science and Innovations, CLEO\_SI 2020 ; Conference date: 10-05-2020 Through 15-05-2020",
year = "2020",
month = jan,
day = "1",
doi = "10.1364/CLEO\_SI.2020.STh1M.5",
language = "English",
isbn = "9781943580767",
series = "Optics InfoBase Conference Papers",
publisher = "Optica Publishing Group (formerly OSA)",
booktitle = "CLEO",
}