@inproceedings{8dbefffb489341d8a3f30e7307fe85f5,
title = "Resolution Enhancement in Scanning Electron Microscopy using Deep Learning",
abstract = "We present a deep learning-based framework to perform image super-resolution in scanning electron microscopy. The technique was demonstrated to perform a resolution enhancement using a standard resolution test target and hydrogel samples.",
author = "\{De Haan\}, Kevin and Ballard, \{Zachary S.\} and Yair Rivenson and Yichen Wu and Aydogan Ozcan",
note = "Publisher Copyright: {\textcopyright} 2020 OSA.; 2020 Conference on Lasers and Electro-Optics, CLEO 2020 ; Conference date: 10-05-2020 Through 15-05-2020",
year = "2020",
month = may,
day = "1",
language = "English",
series = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",
publisher = "Institute of Electrical and Electronics Engineers",
booktitle = "2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings",
address = "United States",
}