Response to "comment on Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy' " [Appl. Phys. Lett. 96, 216101 (2010)]

R. Shikler; Y. Rosenwaks

doi:10.1063/1.3431744

Response to "comment on Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy' " [Appl. Phys. Lett. 96, 216101 (2010)]

Department of Electrical & Computer Engineering

Research output: Contribution to journal › Comment/debate

Original language	English
Article number	216102
Journal	Applied Physics Letters
Volume	96
Issue number	21
DOIs	https://doi.org/10.1063/1.3431744
State	Published - 24 May 2010

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.3431744

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title = "Response to {"}comment on Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy' {"} [Appl. Phys. Lett. 96, 216101 (2010)]",

author = "R. Shikler and Y. Rosenwaks",

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volume = "96",

journal = "Applied Physics Letters",

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publisher = "American Institute of Physics",

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AU - Shikler, R.

AU - Rosenwaks, Y.

PY - 2010/5/24

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ER -

Response to "comment on Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy' " [Appl. Phys. Lett. 96, 216101 (2010)]

ASJC Scopus subject areas

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