TY - GEN
T1 - Reverberation compensation for speaker verification
AU - Peer, Itai
AU - Rafaely, Boaz
AU - Zigel, Yaniv
PY - 2008/12/1
Y1 - 2008/12/1
N2 - Reverberation effects introduce a great challenge for speaker verification systems. However, only few studies considered reverberation with speaker verification. These studies did not exploit some of the advanced techniques for channel mismatch in the speaker verification literature. Contemporary techniques for channel and microphones mismatch in speaker verification are based on session variability modeling. One such method is the compensation of nuisance factors, a session variability method at the feature level, which is based on eigenchannel modeling. We adapted this method for reverberant speech and also integrated it with the reverberant model matching method examined in previous studies. The integration leads to the best results under reverberation, especially for high reverberation times.
AB - Reverberation effects introduce a great challenge for speaker verification systems. However, only few studies considered reverberation with speaker verification. These studies did not exploit some of the advanced techniques for channel mismatch in the speaker verification literature. Contemporary techniques for channel and microphones mismatch in speaker verification are based on session variability modeling. One such method is the compensation of nuisance factors, a session variability method at the feature level, which is based on eigenchannel modeling. We adapted this method for reverberant speech and also integrated it with the reverberant model matching method examined in previous studies. The integration leads to the best results under reverberation, especially for high reverberation times.
KW - Model matching
KW - Nuisance factors
KW - Reverberation
KW - Speaker verification
UR - https://www.scopus.com/pages/publications/62749122230
U2 - 10.1109/EEEI.2008.4736716
DO - 10.1109/EEEI.2008.4736716
M3 - Conference contribution
AN - SCOPUS:62749122230
SN - 9781424424825
T3 - IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings
SP - 333
EP - 337
BT - 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2008
T2 - 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2008
Y2 - 3 December 2008 through 5 December 2008
ER -