Scanning probe microscopy of well-defined periodically poled ferroelectric domain structure

M. Shvebelman; P. Urenski; R. Shikler; G. Rosenman; Y. Rosenwaks; M. Molotskii

doi:10.1063/1.1456967

Scanning probe microscopy of well-defined periodically poled ferroelectric domain structure

M. Shvebelman, P. Urenski, R. Shikler, G. Rosenman, Y. Rosenwaks, M. Molotskii

Research output: Contribution to journal › Article › peer-review

21 Scopus citations

Abstract

We analyze and determine the factors governing the contrast in contact mode atomic force microscopy of domain-structured ferroelectric crystals. The analysis is applied to measurements conducted on KTiOPO₄ crystals with artificially created well-defined domain structure. It is found that the amplitude contrast is due to difference in the work functions of the antiparallel domains.

Original language	English
Pages (from-to)	1806-1808
Number of pages	3
Journal	Applied Physics Letters
Volume	80
Issue number	10
DOIs	https://doi.org/10.1063/1.1456967
State	Published - 11 Mar 2002
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.1456967

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title = "Scanning probe microscopy of well-defined periodically poled ferroelectric domain structure",

abstract = "We analyze and determine the factors governing the contrast in contact mode atomic force microscopy of domain-structured ferroelectric crystals. The analysis is applied to measurements conducted on KTiOPO4 crystals with artificially created well-defined domain structure. It is found that the amplitude contrast is due to difference in the work functions of the antiparallel domains.",

author = "M. Shvebelman and P. Urenski and R. Shikler and G. Rosenman and Y. Rosenwaks and M. Molotskii",

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AU - Shvebelman, M.

AU - Urenski, P.

AU - Shikler, R.

AU - Rosenman, G.

AU - Rosenwaks, Y.

AU - Molotskii, M.

PY - 2002/3/11

Y1 - 2002/3/11

N2 - We analyze and determine the factors governing the contrast in contact mode atomic force microscopy of domain-structured ferroelectric crystals. The analysis is applied to measurements conducted on KTiOPO4 crystals with artificially created well-defined domain structure. It is found that the amplitude contrast is due to difference in the work functions of the antiparallel domains.

AB - We analyze and determine the factors governing the contrast in contact mode atomic force microscopy of domain-structured ferroelectric crystals. The analysis is applied to measurements conducted on KTiOPO4 crystals with artificially created well-defined domain structure. It is found that the amplitude contrast is due to difference in the work functions of the antiparallel domains.

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DO - 10.1063/1.1456967

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JF - Applied Physics Letters

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Scanning probe microscopy of well-defined periodically poled ferroelectric domain structure

Abstract

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