Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells

Sascha Sadewasser, Iris Visoly-Fisher

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

1 Scopus citations

Abstract

This chapter demonstrates scanning probe microscopy that allows spatially resolved characterization at high resolution. Kelvin probe force microscope (KPFM), and scanning capacitance microscopy (SCM) and other techniques are introduced for understanding experiments utilizing these techniques. A typical AFM setup consists of a probe in the shape of a cantilever with a small tip at its free end, a laser, a four-quadrant photodiode, and a scanner unit. The latter is usually constructed from piezoelectric elements. In STM the AFM probe consisting of a cantilever and tip is replaced by a sharp conducting tip. The chapter serves to describe a few examples of the application of the various scanning probe microscopy techniques such as surface homogeneity, and allows the reader to see what kind of information is accessible by the various methods. Characterization of film morphology as a function of its deposition parameters is the most common use of scanning probe microscopy in thin-film inorganic solar cells.
Original languageEnglish
Title of host publicationAdvanced Characterization Techniques for Thin Film Solar Cells
EditorsDaniel Abou-Ras, Thomas Kirchartz, Uwe Rau
PublisherWiley-VCH
Pages343-369
Number of pages27
Volume1-2
Edition2
ISBN (Electronic)9783527699025
ISBN (Print)9783527339921
DOIs
StatePublished - 7 Sep 2016

ASJC Scopus subject areas

  • Physics and Astronomy (all)

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