This chapter demonstrates scanning probe microscopy that allows spatially resolved characterization at high resolution. Kelvin probe force microscope (KPFM), and scanning capacitance microscopy (SCM) and other techniques are introduced for understanding experiments utilizing these techniques. A typical AFM setup consists of a probe in the shape of a cantilever with a small tip at its free end, a laser, a four-quadrant photodiode, and a scanner unit. The latter is usually constructed from piezoelectric elements. In STM the AFM probe consisting of a cantilever and tip is replaced by a sharp conducting tip. The chapter serves to describe a few examples of the application of the various scanning probe microscopy techniques such as surface homogeneity, and allows the reader to see what kind of information is accessible by the various methods. Characterization of film morphology as a function of its deposition parameters is the most common use of scanning probe microscopy in thin-film inorganic solar cells.
|Title of host publication||Advanced Characterization Techniques for Thin Film Solar Cells|
|Editors||Daniel Abou-Ras, Thomas Kirchartz, Uwe Rau|
|Number of pages||27|
|State||Published - 7 Sep 2016|
ASJC Scopus subject areas
- Physics and Astronomy (all)