Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells

Sascha Sadewasser, Iris Visoly-Fisher

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

5 Scopus citations
Original languageEnglish
Title of host publicationAdvanced Characterization Techniques for Thin Film Solar Cells
EditorsDaniel Abou-Ras, Thomas Kirchartz, Uwe Rau
Number of pages24
ISBN (Print)9783527410033
StatePublished - 7 Apr 2011


  • Atomic force microscopy (AFM)
  • Kelvin probe force microscope (KPFM)
  • Phase-locked loop (PLL)
  • Scanning capacitance microscopy (SCM)
  • Scanning spreading resistance microscopy (SSRM)
  • Tip-sample interaction

ASJC Scopus subject areas

  • Materials Science (all)

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