Sensitivity enhancement of guided-wave surface-plasmon resonance sensors

Amit Lahav; Mark Auslander; I. Abdulhalim

doi:10.1364/OL.33.002539

Sensitivity enhancement of guided-wave surface-plasmon resonance sensors

Amit Lahav
, Mark Auslander
, I. Abdulhalim

Research output: Contribution to journal › Article › peer-review

255 Scopus citations

Abstract

It is demonstrated theoretically and experimentally that, by using the guided-wave surface-plasmon sensor configuration with a top layer of dielectric thin film (10-15 nm) having a high value of the real part of the dielectric function, it is possible to improve the sensitivity of the sensor up to 1 order of magnitude. The stability is improved because the thin nanolayer acts as a protection layer for the metal. The enhancement is due to the increase in the interaction volume and the evanescent field enhancement near the top layer-analyte interface.

Original language	English
Pages (from-to)	2539-2541
Number of pages	3
Journal	Optics Letters
Volume	33
Issue number	21
DOIs	https://doi.org/10.1364/OL.33.002539
State	Published - 1 Nov 2008

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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@article{2627b273624848fd95d633a81e7a228b,

title = "Sensitivity enhancement of guided-wave surface-plasmon resonance sensors",

abstract = "It is demonstrated theoretically and experimentally that, by using the guided-wave surface-plasmon sensor configuration with a top layer of dielectric thin film (10-15 nm) having a high value of the real part of the dielectric function, it is possible to improve the sensitivity of the sensor up to 1 order of magnitude. The stability is improved because the thin nanolayer acts as a protection layer for the metal. The enhancement is due to the increase in the interaction volume and the evanescent field enhancement near the top layer-analyte interface.",

author = "Amit Lahav and Mark Auslander and I. Abdulhalim",

year = "2008",

month = nov,

day = "1",

doi = "10.1364/OL.33.002539",

language = "English",

volume = "33",

pages = "2539--2541",

journal = "Optics Letters",

issn = "0146-9592",

publisher = "Optica Publishing Group (formerly OSA)",

number = "21",

}

TY - JOUR

T1 - Sensitivity enhancement of guided-wave surface-plasmon resonance sensors

AU - Lahav, Amit

AU - Auslander, Mark

AU - Abdulhalim, I.

PY - 2008/11/1

Y1 - 2008/11/1

N2 - It is demonstrated theoretically and experimentally that, by using the guided-wave surface-plasmon sensor configuration with a top layer of dielectric thin film (10-15 nm) having a high value of the real part of the dielectric function, it is possible to improve the sensitivity of the sensor up to 1 order of magnitude. The stability is improved because the thin nanolayer acts as a protection layer for the metal. The enhancement is due to the increase in the interaction volume and the evanescent field enhancement near the top layer-analyte interface.

AB - It is demonstrated theoretically and experimentally that, by using the guided-wave surface-plasmon sensor configuration with a top layer of dielectric thin film (10-15 nm) having a high value of the real part of the dielectric function, it is possible to improve the sensitivity of the sensor up to 1 order of magnitude. The stability is improved because the thin nanolayer acts as a protection layer for the metal. The enhancement is due to the increase in the interaction volume and the evanescent field enhancement near the top layer-analyte interface.

UR - https://www.scopus.com/pages/publications/55849106264

U2 - 10.1364/OL.33.002539

DO - 10.1364/OL.33.002539

M3 - Article

C2 - 18978913

AN - SCOPUS:55849106264

SN - 0146-9592

VL - 33

SP - 2539

EP - 2541

JO - Optics Letters

JF - Optics Letters

IS - 21

ER -

Sensitivity enhancement of guided-wave surface-plasmon resonance sensors

Abstract

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